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David McComb

  • Professor & Ohio Res. Scholar, Materials Science Engineering
  • Center for Electron Microscopy and Analysis
    1305 Kinnear Road
    Columbus, OH 43212
  • 614-643-3462

Honors

  • 20111001

    Adjunct Professor.

  • 20060101

    Rector's Award.

  • 20040101

    Honorary Research Fellow.

  • 19930101

    Innovation in research prize.

  • 19900101-19920101

    Research Fellowship.

  • 19900101-19920101

    Research Fellow.

Journal Articles

2015

  • Carnevale,Santino,D; Deitz,Julia,I; Carlin,John,A; Picard,Yoosuf,N; McComb,David,W; De Graef,Marc; Ringel,Steven,A; Grassman,Tyler,J, 2015, "Applications of Electron Channeling Contrast Imaging for the Rapid Characterization of Extended Defects in III-V/Si Heterostructures." IEEE JOURNAL OF PHOTOVOLTAICS 5, no. 2, 676-682 - 676-682.
  • Erhard,N; Sarwar,A,TMGolam; Yang,F; McComb,D,W; Myers,R,C; Holleitner,A,W, 2015, "Optical Control of Internal Electric Fields in Band Gap-Graded InGaN Nanowires." NANO LETTERS 15, no. 1, 332-338 - 332-338.
  • Sarwar,A,TMGolam; Carnevale,Santino,D; Kent,Thomas,F; Yang,Fan; McComb,David,W; Myers,Roberto,C, 2015, "Tuning the polarization-induced free hole density in nanowires graded from GaN to AlN." APPLIED PHYSICS LETTERS 106, no. 3, 032102 - 032102.

2013

  • Menzel,Robert; Duerrbeck,Andre; Liberti,Emanuela; Yau,Hin,Chun; McComb,David; Shaffer,Milo,SP, 2013, "Determining the Morphology and Photocatalytic Activity of Two-Dimensional Anatase Nanoplatelets Using Reagent Stoichiometry." CHEMISTRY OF MATERIALS 25, no. 10, 2137-2145 - 2137-2145.

2011

  • McGilvery,Catriona,M; McComb,David,W; De Gendt,Stefan; Payzant,E,Andrew; Mackenzie,Maureen; Craven,Alan,J, 2011, "Characterization of Hafnia Powder Prepared from an Oxychloride Sol-Gel." JOURNAL OF THE AMERICAN CERAMIC SOCIETY 94, no. 3, 886-894 - 886-894.

2010

  • Clarke, E; Howe, P; Taylor, M; Spencer, P; Harbord, E; Murray, R; Kadkhodazadeh, S; McComb, DW; Stevens, BJ; Hogg, RA, 2010, "Persistent template effect in InAs/GaAs quantum dot bilayers." JOURNAL OF APPLIED PHYSICS 107, no. 11,
  • An, Y; Skinner, SJ; McComb, DW, 2010, "Template-assisted fabrication of macroporous thin films for solid oxide fuel cells." JOURNAL OF MATERIALS CHEMISTRY 20, no. 2, 248-254 - 248-254.
  • Jantou-Morris,V; Horton,Michael,A; McComb,David,W, 2010, "The nano-morphological relationships between apatite crystals and collagen fibrils in ivory dentine." BIOMATERIALS 31, no. 19, 5275-5286 - 5275-5286.
  • Ayub,Mariam; Ivanov,Aleksandar; Instuli,Emanuele; Cecchini,Michael; Chansin,Guillaume; McGilvery,Catriona; Hong,Jongin; Baldwin,Geoff; McComb,David; Edel,Joshua,B; Albrecht,Tim, 2010, "Nanopore/electrode structures for single-molecule biosensing." ELECTROCHIMICA ACTA 55, no. 27, 8237-8243 - 8237-8243.
  • Cavallaro,Andrea; Burriel,Monica; Roqueta,Jaume; Apostolidis,Alexandra; Bernardi,Alessandro; Tarancon,Albert; Srinivasan,Rajagopalan; Cook,Stuart,N; Fraser,Hamish,L; Kilner,John,A; McComb,David,W; Santiso,Jose, 2010, "Electronic nature of the enhanced conductivity in YSZ-STO multilayers deposited by PLD." SOLID STATE IONICS 181, no. 13-14, 592-601 - 592-601.
  • Eustace, DA; McComb, DW; Craven, AJ, 2010, "Probing magnetic order in EELS of chromite spinels using both multiple scattering (FEFF8.2) and DFT (WIEN2k)." MICRON 41, no. 6, 547-553 - 547-553.
  • Wang, H; Mauthoor, S; Din, S; Gardener, JA; Chang, R; Warner, M; Aeppli, G; McComb, DW; Ryan, MP; Wu, W; Fisher, AJ; Stoneham, M; Heutz, S, 2010, "Ultra long Copper Phthalocyanine Nanowires with New Crystal Structure and Broad Optical Absorption." ACS NANO 4, no. 7, 3921-3926 - 3921-3926.

2009

  • Bland, PA; Jackson, MD; Coker, RF; Cohen, BA; Webber, JBW; Lee, MR; Duffy, CM; Chater, RJ; Ardakani, MG; McPhail, DS; McComb, DW; Benedix, GK, 2009, "Why aqueous alteration in asteroids was isochemical: High porosity not equal high permeability." EARTH AND PLANETARY SCIENCE LETTERS 287, no. 3-4, 559-568 - 559-568.
  • Lackner,D; Pitts,O,J; Najmi,S; Sandhu,P; Kavanagh,K,L; Yang,A; Steger,M; Thewalt,M,LW; Wang,Y; McComb,D,W; Bolognesi,C,R; Watkins,S,P, 2009, "Growth of InAsSb/InAs MQWs on GaSb for mid-IR photodetector applications." JOURNAL OF CRYSTAL GROWTH 311, no. 14, 3563-3567 - 3563-3567.
  • Thomson, NR; McLachlan, MA; Bower, CL; McComb, DW, 2009, "Formation of Patterned Arrays of Polystyrene Colloidal Crystal Structures on Flexible Functional Substrates." LANGMUIR 25, no. 19, 11344-11350 - 11344-11350.
  • MacLaren, I; Ras, T; MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2009, "Texture, Twinning, and Metastable "Tetragonal" Phase in Ultrathin Films of HfO2 on a Si Substrate." JOURNAL OF THE ELECTROCHEMICAL SOCIETY 156, no. 8, G103-G108 - G103-G108.
  • Jantou,V; Turmaine,M; West,G,D; Horton,M,A; McComb,D,W, 2009, "Focused ion beam milling and ultramicrotomy of mineralised ivory dentine for analytical transmission electron microscopy." MICRON 40, no. 4, 495-501 - 495-501.
  • Moore, JD; Cohen, LF; Yeshurun, Y; Caplin, AD; Morrison, K; Yates, KA; McGilvery, CM; Perkins, JM; McComb, DW; Trautmann, C; Ren, ZA; Yang, J; Lu, W; Dong, XL; Zhao, ZX, 2009, "The effect of columnar defects on the pinning properties of NdFeAsO0.85 conglomerate particles." SUPERCONDUCTOR SCIENCE & TECHNOLOGY 22, no. 12,
  • Koh,Ai,Leen; Bao,Kui; Khan,Imran; Smith,W,Ewen; Kothleitner,Gerald; Nordlander,Peter; Maier,Stefan,A; McComb,David,W, 2009, "Electron Energy-Loss Spectroscopy (EELS) of Surface Plasmons in Single Silver Nanoparticles and Dimers: Influence of Beam Damage and Mapping of Dark Modes." ACS NANO 3, no. 10, 3015-3022 - 3015-3022.
  • Breeze,Jonathan,D; Perkins,James,M; McComb,David,W; Alford,Neil,McN, 2009, "Do Grain Boundaries Affect Microwave Dielectric Loss in Oxides?." JOURNAL OF THE AMERICAN CERAMIC SOCIETY 92, no. 3, 671-674 - 671-674.
  • Zhu,Rong; McLachlan,Martyn; Reyntjens,Steve; Tariq,Farid; Ryan,Mary,P; McComb,David,W, 2009, "Controlling the electrodeposition of mesoporous metals for nanoplasmonics." NANOSCALE 1, no. 3, 355-359 - 355-359.

2008

  • Harkins, P; MacKenzie, M; Craven, AJ; McComb, DW, 2008, "Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate." MICRON 39, no. 6, 709-716 - 709-716.
  • Moore,J,D; Morrison,K; Yates,K,A; Caplin,A,D; YESHURUN,Y; Cohen,L,F; Perkins,J,M; McGilvery,C,M; McComb,D,W; Ren,Z,A; Yang,J; Lu,W; Dong,X,L; Zhao,Z,X, 2008, "Evidence for supercurrent connectivity in conglomerate particles in NdFeAsO1-delta." SUPERCONDUCTOR SCIENCE & TECHNOLOGY 21, no. 9, 092004 - 092004.
  • Thomson, NR; Bower, CL; McComb, DW, 2008, "Identification of mechanisms, competing with self-assembly during directed colloidal deposition." JOURNAL OF MATERIALS CHEMISTRY 18, no. 21, 2500-2505 - 2500-2505.
  • MacKenzie,M; Craven,A,J; McComb,D,W; McGilvery,C,M; McFadzean,S; De Gendt,S, 2008, "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 313-316 - 313-316.
  • McLachlana, MA; Barron, CCA; Johnson, NP; De La Rue, RM; McComb, DW, 2008, "Preparation of large area three-dimensionally ordered macroporous thin films by confined infiltration and crystallisation." JOURNAL OF CRYSTAL GROWTH 310, no. 10, 2644-2648 - 2644-2648.
  • Craven,A,J; MacKenzie,M; McComb,D,W, 2008, "Nanoanalysis of high-k dielectrics on semiconductors." IPFA 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS 1, 269-274 - 269-274.
  • Craven,A,J; MacKenzie,M; McComb,D,W, 2008, "Nanoanalysis of high-k dielectrics on semiconductors." IPFA 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS 1, 269-274 - 269-274.
  • Jasper, A; Kilner, JA; McComb, DW, 2008, "TEM and impedance spectroscopy of doped ceria electrolytes." SOLID STATE IONICS 179, no. 21-26, 904-908 - 904-908.
  • Wang,Y,Q; Nikitin,K; McComb,D,W, 2008, "Fabrication of Au-Cu2O core-shell nanocube heterostructures." CHEMICAL PHYSICS LETTERS 456, no. 4-6, 202-205 - 202-205.
  • Khokhar,A,Z; De La Rue,R,M; Treble,B,M; McComb,D,W; Johnson,N,P, 2008, "Stibnite inverse opal." MICRO & NANO LETTERS 3, no. 1, 1-6 - 1-6.
  • Eustace,D,A; McComb,D,W; Buckle,L; Buckle,P; Ashley,T; Singh,L,J; Barber,Z,H; Gilbertson,A,M; Branford,W,R; Clowes,S,K; Cohen,L,F, 2008, "(S)TEM Characterisation of InAs/MgO/Co Multilayers." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 153-156 - 153-156.
  • McGilvery,C,M; McFadzean,S; MacKenzie,M; Docherty,F,T; Craven,A,J; McComb,D,W; De Gendt,S, 2008, "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." MICROSCOPY OF SEMICONDUCTING MATERIALS 2007 120, 325-328 - 325-328.
  • Schaeffer,Nicolas; Tan,Bien; Dickinson,Calum; Rosseinsky,Matthew,J; Laromaine,Anna; McComb,David,W; Stevens,Molly,M; Wang,Yiqian; Petit,Laure; Barentin,Catherine; Spiller,David,G; Cooper,Andrew,I; Levy,Raphael, 2008, "Fluorescent or not? Size-dependent fluorescence switching for polymer-stabilized gold clusters in the 1.1-1.7 nm size range." CHEMICAL COMMUNICATIONS 1, no. 34, 3986-3988 - 3986-3988.
  • Li, WX; Fenton, JC; Wang, YQ; McComb, DW; Warburton, PA, 2008, "Tunability of the superconductivity of tungsten films grown by focused-ion-beam direct writing." JOURNAL OF APPLIED PHYSICS 104, no. 9,
  • Docherty, FT; MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S; McFadzean, S; McGilvery, CM, 2008, "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." MICROELECTRONIC ENGINEERING 85, no. 1, 61-64 - 61-64.

2007

  • Singh, LJ; Oliver, RA; Barber, ZH; Eustace, DA; McComb, DW; Clowes, SK; Gilbertson, AM; Magnus, F; Branford, WR; Cohen, LF; Buckle, L; Buckle, PD; Ashley, T, 2007, "Preparation of InAs(001) surface for spin injection via a chemical route." JOURNAL OF PHYSICS D-APPLIED PHYSICS 40, no. 10, 3190-3193 - 3190-3193.
  • McLachlan, MA; McComb, DW; Berhanu, S; Jones, TS, 2007, "Template directed synthesis of nanostructured phthalocyanine thin films." JOURNAL OF MATERIALS CHEMISTRY 17, no. 36, 3773-3776 - 3773-3776.
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S; Docherty, FT; McGilvery, CM; McFadzean, S, 2007, "Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation." ELECTROCHEMICAL AND SOLID STATE LETTERS 10, no. 6, G33-G35 - G33-G35.
  • Barquin,L,Fernandez; Calderon,R,Garcia; Farago,B; Rodriguez-Carvajal,J; Bleloch,A; McComb,D; Chater,R; Pankhurst,Q,A, 2007, "Neutron spin echo evidence of mesoscopic spin correlations among Fe(Cu) ferromagnetic nanoparticles in a silver diamagnetic matrix." PHYSICAL REVIEW B 76, no. 17, 172404 - 172404.
  • Magnus, F; Clowes, SK; Gilbertson, AM; Branford, WR; Barkhoudarov, ED; Cohen, LF; Singh, LJ; Barber, ZH; Blamire, MG; Buckle, PD; Buckle, L; Ashley, T; Eustace, DA; McComb, DW, 2007, "Electrical characterization of MgO tunnel barriers grown on InAs (001) epilayers." APPLIED PHYSICS LETTERS 91, no. 12,
  • Barron, CCA; McLachlan, M; Zhang, Q; McComb, DW, 2007, "Ferroelectric three-dimensionally ordered macroporous thin films." INTEGRATED FERROELECTRICS 92, 43-52 - 43-52.

2006

  • Khan, IR; Cunningham, D; Lazar, S; Graham, D; Smith, WE; McComb, DW, 2006, "A TEM and electron energy loss spectroscopy (EELS) investigation of active and inactive silver particles for surface enhanced resonance Raman spectroscopy (SERRS)." FARADAY DISCUSSIONS 132, 171-178 - 171-178.
  • Mackenzie,M; Craven,A,J; Hamilton,D,A; McComb,D,W, 2006, "Electron energy-loss spectrum imaging of high-k dielectric stacks." APPLIED PHYSICS LETTERS 88, no. 2, 022108 - 022108.
  • Eustace,D,A; Docherty,F,T; McComb,D,W; Craven,A,J, 2006, "ELNES as a probe of magnetic order in mixed oxides." EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE 26, 165-168 - 165-168.
  • Litvinenko, KL; Murdin, BN; Allam, J; Pidgeon, CR; Zhang, T; Harris, JJ; Cohen, LF; Eustace, DA; McComb, DW, 2006, "Spin lifetime in InAs epitaxial layers grown on GaAs." PHYSICAL REVIEW B 74, no. 7,
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2006, "Interfacial reactions in a HfO2/TiN/poly-Si gate stack." APPLIED PHYSICS LETTERS 88, no. 19,
  • MacKenzie, M; Craven, AJ; McComb, DW; De Gendt, S, 2006, "Advanced nanoanalysis of high-k dielectric stacks." JOURNAL OF THE ELECTROCHEMICAL SOCIETY 153, no. 9, F215-F218 - F215-F218.
  • Mackenzie,M; Craven,A,J; McComb,D,W; De Gendt,S, 2006, "Interfacial reactions in a HfO2/TiN/poly-Si gate stack." APPLIED PHYSICS LETTERS 88, no. 19, 192112 - 192112.
  • Jin, CJ; Li, ZY; McLachlan, MA; McComb, DW; De La Rue, RM; Johnson, NP, 2006, "Optical properties of tetragonal photonic crystal synthesized via template-assisted self-assembly." JOURNAL OF APPLIED PHYSICS 99, no. 11,
  • T Docherty,F; MacKenzie,M; Pennicard,D; Craven,A,J; McComb,D,W, 2006, "Understanding and preventing beam damage effects in partially processed high-k gate stacks." EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE 26, 231-234 - 231-234.
  • Khan, I; Cunningham, D; Littleford, RE; Graham, D; Smith, WE; McComb, DW, 2006, "From micro to nano: Analysis of surface-enhanced resonance Raman spectroscopy active sites via multiscale correlations." ANALYTICAL CHEMISTRY 78, no. 1, 224-230 - 224-230.
  • Cunningham, D; Littleford, RE; Smith, WE; Lundahl, PJ; Khan, I; McComb, DW; Graham, D; Laforest, N, 2006, "Practical control of SERRS enhancement." FARADAY DISCUSSIONS 132, 135-145 - 135-145.

2005

  • Littleford,R,E; Cunningham,D; Matousek,P; Towrie,M; Parker,A,W; Khan,I; McComb,D; Smith,W,E, 2005, "Surface-enhanced resonance Raman scattering using pulsed and continuous-wave laser excitation." JOURNAL OF RAMAN SPECTROSCOPY 36, no. 6-7, 600-605 - 600-605.
  • Khan, I; Cunningham, D; Graham, D; McComb, DW; Smith, WE, 2005, "Identification and characterization of active and inactive species for surface-enhanced resonance Raman scattering." JOURNAL OF PHYSICAL CHEMISTRY B 109, no. 8, 3454-3459 - 3454-3459.
  • McLachlan, MA; Johnson, NP; De La Rue, R; McComb, DW, 2005, "Domain size and thickness control of thin film photonic crystals." JOURNAL OF MATERIALS CHEMISTRY 15, no. 3, 369-371 - 369-371.
  • Jin,C,J; McLachlan,M,A; McComb,D,W; De La Rue,R,M; Johnson,N,P, 2005, "Template-assisted growth of nominally cubic (100)-oriented three-dimensional crack-free photonic crystals." NANO LETTERS 5, no. 12, 2646-2650 - 2646-2650.
  • Hobbs, L; Eddie, I; Erwin, G; Bryce, AC; De la Rue, RM; Roberts, JS; Krauss, TF; Mccomb, DW; Mackenzie, M, 2005, "Reprocessing of thermally oxidized aluminum arsenide (AlAs) in epitaxial multilayers without delamination." JOURNAL OF ELECTRONIC MATERIALS 34, no. 3, 232-239 - 232-239.
  • MacKenzie, M; Weatherly, GC; McComb, DW; Craven, AJ, 2005, "Electron energy loss spectroscopy of a TiAlN coating on stainless steel." SCRIPTA MATERIALIA 53, no. 8, 983-987 - 983-987.
  • Craven, AJ; MacKenzie, M; McComb, DW; Docherty, FT, 2005, "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." MICROELECTRONIC ENGINEERING 80, 90-97 - 90-97.

2004

  • McLachlan,M,A; Johnson,N,P; De La Rue,R,M; McComb,D,W, 2004, "Thin film photonic crystals: synthesis and characterisation." JOURNAL OF MATERIALS CHEMISTRY 14, no. 2, 144-150 - 144-150.
  • Hamilton, DA; Craven, AJ; MacKenzie, M; McComb, DW, 2004, "Understanding gate oxide materials: ELNES of Hf and Zr compounds." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 79-82 - 79-82.
  • McComb, DW; Craven, AJ; Hamilton, DA; MacKenzie, M, 2004, "Probing local coordination environments in high-k materials for gate stack applications." APPLIED PHYSICS LETTERS 84, no. 22, 4523-4525 - 4523-4525.
  • Ross, IM; Rainforth, WM; Scott, AJ; Brown, AP; Brydson, R; McComb, DW, 2004, "Electron energy-loss spectroscopy (EELS) studies of an yttria stabilized TZP ceramic." JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 24, no. 7, 2023-2029 - 2023-2029.
  • MacKenzie, M; Craven, AJ; McComb, DW; Hamilton, DA; McFadzean, S, 2004, "Spectrum imaging of high-k dielectric stacks." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 299-302 - 299-302.
  • Harkins, P; McComb, DW; MacKenzie, M; Craven, AJ, 2004, "ELNES of titanate perovskites - a probe of structure and bonding." ELECTRON MICROSCOPY AND ANALYSIS 2003 no. 179, 119-122 - 119-122.
  • Khan, I; Polwart, E; McComb, DW; Smith, WE, 2004, "Correlation of optical properties with structure of immoblised nanoparticles - a method for probing the mechanism of SERRS." ANALYST 129, no. 10, 950-955 - 950-955.

2003

  • Haswell,R; McComb,D,W; Smith,W, 2003, "Preparation of site-specific cross-sections of heterogeneous catalysts prepared by focused ion beam milling." JOURNAL OF MICROSCOPY-OXFORD 211, 161-166 - 161-166.

2002

  • Ostanin, S; Salamatov, E; Craven, AJ; McComb, DW; Vlachos, D, 2002, "Theory of the phases and atomistic structure of yttria-doped zirconia." PHYSICAL REVIEW B 66, no. 13,
  • Ostanin, S; Craven, AJ; McComb, DW; Vlachos, D; Alavi, A; Paxton, AT; Finnis, MW, 2002, "Electron energy-loss near-edge shape as a probe to investigate the stabilization of yttria-stabilized zirconia." PHYSICAL REVIEW B 65, no. 22,

2001

  • Ross, IM; Rainforth, WM; McComb, DW; Scott, AJ; Brydson, R, 2001, "The role of trace additions of alumina to yttria-tetragonal zirconia polycrystals (Y-TZP)." SCRIPTA MATERIALIA 45, no. 6, 653-660 - 653-660.
  • McComb, DW; Treble, BM; Smith, CJ; De La Rue, RM; Johnson, NP, 2001, "Synthesis and characterisation of photonic crystals." JOURNAL OF MATERIALS CHEMISTRY 11, no. 1, 142-148 - 142-148.
  • Ross, IM; Rainforth, WM; McComb, DW; Scott, AJ; Brydson, R, 2001, "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 299-302 - 299-302.
  • Johnson, NP; McComb, DW; Richel, A; Treble, BM; De la Rue, RM, 2001, "Synthesis and optical properties of opal and inverse opal photonic crystals." SYNTHETIC METALS 116, no. 1-3, 469-473 - 469-473.
  • Maclean, EDW; Craven, AJ; McComb, DW, 2001, "Valence losses at interfaces in aluminium alloys." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 259-262 - 259-262.
  • Kealey, CP; Klapotke, TM; McComb, DW; Robertson, MI; Winfield, JM, 2001, "Fluorination of polycrystalline diamond films and powders. An investigation using FTIR spectroscopy, SEM, energy-filtered TEM, XPS and fluorine-18 radiotracer methods." JOURNAL OF MATERIALS CHEMISTRY 11, no. 3, 879-886 - 879-886.
  • Ross, IM; Rainforth, WM; Scott, AJ; Brown, AP; Brydson, R; McComb, DW, 2001, "Differentiation of zirconia polymorphs using EELS and ELNES." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 303-306 - 303-306.
  • MacKenzie, M; Weatherly, GC; McComb, DW; Perovic, A; Craven, AJ, 2001, "Interfacial reaction products in Al-based metal-matrix composites." ELECTRON MICROSCOPY AND ANALYSIS 2001 no. 168, 283-286 - 283-286.
  • Docherty, FT; Craven, AJ; McComb, DW; Skakle, J, 2001, "ELNES investigations of the oxygen K-edge in spinels." ULTRAMICROSCOPY 86, no. 3-4, 273-288 - 273-288.
  • Vlachos,D; Craven,A,J; McComb,D,W, 2001, "The influence of dopant concentration on the oxygen K-edge ELNES and XANES in yttria-stabilized zirconia." JOURNAL OF PHYSICS-CONDENSED MATTER 13, no. 48, 10799-10809 - 10799-10809.

2000

  • McComb,D,W; Ning,X,G; Weatherly,G,C; Pan,J; Lloyd,D,J, 2000, "Interfacial reaction chemistry in Al-based metal-matrix composites." PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES 80, no. 11, 2509-2527 - 2509-2527.
  • Richel, A; Johnson, NP; McComb, DW, 2000, "Observation of Bragg reflection in photonic crystals synthesized from air spheres in a titania matrix (vol 76, pg 1816, 2000)." APPLIED PHYSICS LETTERS 77, no. 7, 1062-1063 - 1062-1063.
  • Ostanin,S; Craven,A,J; McComb,D,W; Vlachos,D; Alavi,A; Finnis,M,W; Paxton,A,T, 2000, "Effect of relaxation on the oxygen K-edge electron energy-loss near-edge structure in yttria-stabilized zirconia." PHYSICAL REVIEW B 62, no. 22, 14728-14735 - 14728-14735.
  • Richel,A; Johnson,N,P; McComb,D,W, 2000, "Observation of Bragg reflection in photonic crystals synthesized from air spheres in a titania matrix." APPLIED PHYSICS LETTERS 76, no. 14, 1816-1818 - 1816-1818.

1999

  • Docherty, FT; Craven, AJ; McComb, DW, 1999, "ELNES investigations of the structure and electronic properties of chromium spinels." ELECTRON MICROSCOPY AND ANALYSIS 1999 no. 161, 203-206 - 203-206.

1998

  • Piva, PG; Goldberg, RD; Mitchell, IV; Chen, HJ; Feenstra, RM; Weatherly, GC; McComb, DW; Aers, GC; Poole, PJ; Charbonneau, S, 1998, "A comparison of spectroscopic and microscopic observations of ion-induced intermixing in InGaAs/InP quantum wells." APPLIED PHYSICS LETTERS 72, no. 13, 1599-1601 - 1599-1601.

1997

  • Yang, W; Weatherly, GC; McComb, DW; Lloyd, DJ, 1997, "The structure of SiC-reinforced Mg casting alloys." JOURNAL OF MICROSCOPY-OXFORD 185, 292-302 - 292-302.
  • Perovic, DD; Bahierathan, B; Lafontaine, H; Houghton, DC; McComb, DW, 1997, "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." PHYSICA A 239, no. 1-3, 11-17 - 11-17.
  • Okada, T; Weatherly, GC; McComb, DW, 1997, "Growth of strained InGaAs layers on InP substrates." JOURNAL OF APPLIED PHYSICS 81, no. 5, 2185-2196 - 2185-2196.
  • McComb, DW; Weatherly, GC, 1997, "The effect of secondary electrons generated in a commercial FEG-TEM on electron energy-loss spectra." ULTRAMICROSCOPY 68, no. 1, 61-67 - 61-67.

1996

  • McComb, DW; Collings, BA; Wolkow, RA; Moffatt, DJ; MacPherson, CD; Rayner, DM; Hackett, PA; Hulse, JE, 1996, "An atom-resolved view of silicon nanoclusters." CHEMICAL PHYSICS LETTERS 251, no. 1-2, 8-12 - 8-12.
  • McComb,D,W, 1996, "Bonding and electronic structure in zirconia pseudopolymorphs investigated by electron energy-loss spectroscopy." PHYSICAL REVIEW B 54, no. 10, 7094-7102 - 7094-7102.
  • McComb, DW; Okada, T; Weatherly, GC; Wolkow, RA; Hulse, JE, 1996, "Cross-sectional transmission electron microscopy and scanning tunnelling microscopy applied to investigation of phase segregation in III-V multilayers grown by molecular beam epitaxy." PHILOSOPHICAL MAGAZINE LETTERS 73, no. 3, 129-136 - 129-136.

1995

  • MCCOMB, DW; WOLKOW, RA; MOFFATT, DJ; HACKETT, PA, 1995, "ON THE STRUCTURE AND STABILITY OF SI(111)-(7X7) FRAGMENTS CREATED DURING GROWTH OF AG/SI(111)-(ROOT-3X-ROOT-3)." SURFACE SCIENCE 340, no. 1-2, L955-L959 - L955-L959.
  • MCCOMB, DW; HOWIE, A, 1995, "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 96, no. 3-4, 569-574 - 569-574.

1994

  • BARRAS, J; KLINOWSKI, J; MCCOMB, DW, 1994, "AL-27 AND SI-29 SOLID-STATE NMR-STUDIES OF DEALUMINATED MORDENITE." JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS 90, no. 24, 3719-3723 - 3719-3723.
  • MCCOMB, DW; MOFFATT, DJ; HACKETT, PA; WILLIAMS, BR; MASON, BF, 1994, "SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF THE NUCLEATION AND GROWTH OF AG/SI(111)-(ROOT-3X-ROOT-3)." PHYSICAL REVIEW B 49, no. 24, 17139-17148 - 17139-17148.
  • WILLIAMS, BR; MASON, BF; MCCOMB, DW; MOFFATT, DJ; HACKETT, PA, 1994, "A SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF THE REACTION OF HYDROGEN-ATOMS WITH AG/SI(111)-(ROOT-X-ROOT-3." SURFACE SCIENCE 313, no. 1-2, L790-L796 - L790-L796.
  • HANSEN, PL; BRYDSON, R; MCCOMB, DW; RICHARDSON, I, 1994, "EELS FINGERPRINT OF AL-COORDINATION IN SILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 5, no. 3, 173-182 - 173-182.
  • MCCOMB, DW; WOLKOW, RA; HACKETT, PA, 1994, "DEFECTS ON THE AG/SI(111)-(ROOT-3X-ROOT-3) SURFACE." PHYSICAL REVIEW B 50, no. 24, 18268-18274 - 18268-18274.

1993

  • MCGIBBON, AJ; BROWN, LM; BLELOCH, AL; BROWNING, ND; AIRES, FCS; FALLON, PJ; GASKELL, PH; GILKES, KWR; HANSEN, PL; HOWIE, A; MAYNARD, AD; MCCOMB, DW; MCMULLAN, D; MULLEJANS, H; MUROOKA, Y; PATERSON, JH; PEROVIC, DD; PIKE, WT; RAUF, IA; RODENBURG, JM; SAEED, A; STELMASHENKO, N; TU, KN; WALLS, MG; WALSH, CA; YUAN, J; ZHAO, J, 1993, "MICROSCOPY IN SOLID-STATE SCIENCE." MICROSCOPY RESEARCH AND TECHNIQUE 24, no. 4, 299-315 - 299-315.
  • Brydson,R; Richardson,I,G; McComb,D,W; Groves,G,W, 1993, "PARALLEL ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDY OF AL-SUBSTITUTED CALCIUM SILICATE HYDRATE (C-S-H) PHASES PRESENT IN HARDENED CEMENT PASTES." SOLID STATE COMMUNICATIONS 88, no. 2, 183-187 - 183-187.

1992

  • McComb, D.W., 1992, "Interpretation of electron energy-loss spectra of minerals." Micron And Microscopica Acta 23, no. 1-2, 197-198 - 197-198.
  • HANSEN, PL; BRYDSON, R; MCCOMB, DW, 1992, "P -] P-LIKE TRANSITIONS AT THE SILICON L2,3-EDGES OF SILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 3, no. 2-3, 213-219 - 213-219.
  • MCCOMB, DW; BRYDSON, R; HANSEN, PL; PAYNE, RS, 1992, "QUALITATIVE INTERPRETATION OF ELECTRON ENERGY-LOSS NEAR-EDGE STRUCTURE IN NATURAL ZIRCON." JOURNAL OF PHYSICS-CONDENSED MATTER 4, no. 43, 8363-8374 - 8363-8374.

1991

  • MCCOMB, DW; HANSEN, PL; BRYDSON, R, 1991, "A STUDY OF SILICON ELNES IN NESOSILICATES." MICROSCOPY MICROANALYSIS MICROSTRUCTURES 2, no. 5, 561-568 - 561-568.

1990

  • MCCOMB, DW; HOWIE, A, 1990, "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." ULTRAMICROSCOPY 34, no. 1-2, 84-92 - 84-92.

1989

  • BUGLASS, JG; HOWIE, A; MCCOMB, DW, 1989, "APPLICATIONS OF ELECTRON-MICROSCOPY METHODS TO CATALYST PROBLEMS." CATALYSIS LETTERS 3, no. 1, 17-23 - 17-23.

Unknown

  • Pu, Y.; Wang, H.L.; Du, C.H.; Adur, R. et al., "Long-range FMR driven spin pumping through a nonmagnetic insulator."

Papers in Proceedings

2018

  • Sarkar, S.; Deng, B.; Ghatak, S.; Singh, K. et al. "Stem Tomography of Hyper Biofilm Producing Persister Pseudomonas aeruginosa." (1 2018).
  • Sarkar, S.; Deng, B.; Ghatak, S.; Singh, K. et al. "Stem Tomography of Hyper Biofilm Producing Persister Pseudomonas aeruginosa." (1 2018).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the electronic structure at the heterovalent GaP/Si interface using electron energy-loss spectroscopy." (5 2018).

2016

  • Deitz, J.I.; McComb, D.W.; Grassman, T.J.; IEEE, "Probing the Electronic Structure at the Heterovalent GaP/Si Interface using Electron Energy-Loss Spectroscopy." (1 2016).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the electronic structure at the heterovalent GaP/Si interface using electron energy-loss spectroscopy." (11 2016).
  • Deitz, J.I.; McComb, D.W.; Grassman, T.J. "Probing the Electronic Structure at the Heterovalent GaP/Si Interface using Electron Energy-Loss Spectroscopy." in 43rd IEEE Photovoltaic Specialists Conference (PVSC). (1 2016).

2015

  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending Characterization Applications of Electron Channeling Contrast Imaging." (1 2015).
  • Deitz,Julia,I; Carnevale,Santino,D; Ringel,Steven,A; McComb,David,W; Grassman,Tyler,J Extending Characterization Applications of Electron Channeling Contrast Imaging. in IEEE Photovoltaic Specialist Conference (PVSC). http://dx.doi.org/10.1109/pvsc.2015.7356198, (1 2015).
  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending characterization applications of electron channeling contrast imaging." (12 2015).
  • Deng, B.; Barki, K.G.; Ghatak, S.; Roy, S. et al. "THREE-DIMENSIONAL STRUCTURE OF THE WOUND BIOFILM." (1 2015).
  • Deitz, J.I.; Carnevale, S.D.; Ringel, S.A.; McComb, D.W. et al. "Extending Characterization Applications of Electron Channeling Contrast Imaging." in IEEE 42nd Photovoltaic Specialist Conference (PVSC). (1 2015).
  • Deng, B.; Barki, K.G.; Ghatak, S.; Roy, S. et al. "THREE-DIMENSIONAL STRUCTURE OF THE WOUND BIOFILM." (3 2015).

2014

  • Esser, B.D.; D'Alfonso, A.J.; Dixit, M.; Williams, R.E.A. et al. "Understanding B-site disorder in HAADF-STEM images of double perovskite thin films using the quantum excitation of phonons model." (1 2014).
  • Colijn, H.O.; Yang, F.; Williams, D.B.; Sandborg, A. et al. "Performance of an improved TEM SDD detector." (1 2014).
  • Deitz, J.; Carnevale, S.; De Graef, M.; Picard, Y.N. et al. "Using electron channeling contrast imaging for misfit dislocation characterization in heteroepitaxial III-V/Si thin films." (1 2014).
  • Alexander, J.A.; Durstock, M.F.; Tabor, C.E.; Leever, B.J. et al. "Investigation of the use of stereo-pair data sets in electron tomography characterization of organic-based solar cells." (1 2014).
  • Scheltens, F.J.; Durstock, M.F.; Tabor, C.E.; Leever, B.J. et al. "Monochromated electron energy-loss spectroscopy spectrum imaging of organic photovoltaic devices." (1 2014).
  • J. Deitz, S. Carnevale, M. De Graef, Y. N. Picard, S. A. Ringel, T. J. Grassman, D. W. McComb Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films. in Microscopy and Microanalysis. http://htp//dx.doi.org/10.1017/S1431927614004486, (8 2014).
  • Deng, B.; Freria, C.M.; Williams, R.E.A.; Huber, D. et al. "3D visualization of motor-neurons in mice spinal cord using FIB\SEM tomography." (1 2014).
  • Goode, A.E.; Hine, N.D.M.; Chen, S.; Bergin, S.D. et al. "Electron microscopic characterization of functionalized multi-walled carbon nanotubes and their interactions with the blood brain barrier." (1 2014).
  • Williams, R.E.A.; Carnevale, S.D.; Kent, T.F.; Stowe, D.J. et al. "Electron energy loss spectroscopy and localized cathodoluminescence characterization of GaN quantum discs." (1 2014).
  • Yang, F.; Chen, Y.; Cai, Z.; Tsvetkov, N. et al. "High resolution electron microscopy characterization of (La<inf>0.5</inf>Sr<inf>0.5</inf>)<inf>2</inf>CoC<inf>4</inf> thin film cathode materials." (1 2014).
  • Channagiri, S.A.; Viswanathan, G.B.; Nichol, R.; Nagpure, S.C. et al. "Spatially resolved characterization of phases in LiFePO<inf>4</inf> battery cathodes using low loss electron energy-loss spectroscopy." (1 2014).

2012

  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." (8 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." (8 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." (8 2012).
  • Gilchrist,J,B; Heutz,S; McComb,D,W "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Liberti, E.; McGilvery, C.M.; Menzel, R.; Shaffer, M.S.P. et al. "Size effects in nanoscale dielectric materials." (1 2012).
  • Liberti,E; McGilvery,C,M; Menzel,R; Shaffer,M,SP; McComb,D,W "Size effects in nanoscale dielectric materials." in Conference on Electron-Microscopy-and-Analysis-Group (EMAG). (1 2012).
  • Nicholls, R.J.; Perkins, J.M.; Nicolosi, V.; McComb, D.W. et al. "Low-loss EELS of 2D boron nitride." (1 2012).
  • Gilchrist, J.B.; Heutz, S.; McComb, D.W. "Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD." (1 2012).

2011

  • Illy, B.N.; Cruickshank, A.C.; Da Campo, R.; Schumann, S. et al. "Electrodeposition of ultrathin ZnO buffer layers with controllable orientation for photovoltaic applications." (8 2011).

2010

  • McGuire,E,K; Motskin,M; Knowles,T,PJ; Dobson,C,M; McComb,D,W; Porter,A,E "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." (12 2010).
  • Koh, A.L.; Tomanec, O.; Urbánek, M.; Šikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." (12 2010).
  • Koh, A.L.; Tomanec, O.; Urbanek, M.; Sikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." (1 2010).
  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." (1 2010).
  • Koh,Ai,Leen; Tomanec,Ondrej; Urbanek,Michal; Sikola,Tomas; Maier,Stefan,A; McComb,David,W "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • McGuire, E.K.; Motskin, M.; Knowles, T.P.J.; Dobson, C.M. et al. "Imaging Alzheimer's disease-related protein aggregates in human cells using a selenium label." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).
  • Koh, A.L.; Tomanec, O.; Urbanek, M.; Sikola, T. et al. "HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques." in Electron-Microscopy-and-Analysis-Group Conference 2009. (1 2010).

2009

  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).
  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).
  • Srinivasan, R.; Viswanathan, G.B.; Sosa, J.; McComb, D.W. et al. "Factors affecting elemental quantification at the atomic scale using EELS." (7 2009).

2008

  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; McGilvery, C.M. et al. "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." (1 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." in Conference on Organic Photovoltaics IX. (1 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." (12 2008).
  • Zhu, R.; McLachlan, M.A.; McComb, D.W.; Ryan, M.P. "Electrochemically grown metallic inverse opals." (12 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." (12 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." (1 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McLachlan, M.A.; Ying, A.; Kilner, J.A.; McComb, D.W. et al. "Engineered nanocomposites for solid oxide fuel cells by colloidal crystal templating." (12 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." (12 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." (12 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery, C.M.; McFadzean, S.; MacKenzie, M.; Docherty, F.T. et al. "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: a study of magnetic order." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Eustace, D.A.; McComb, D.W.; Buckle, L.; Buckle, P. et al. "(S)TEM Characterisation of InAs/MgO/Co Multilayers." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." (1 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." (1 2008).
  • Eustace, D.A.; McComb, D.W.; Buckle, L.; Buckle, P. et al. "(S)TEM Characterisation of InAs/MgO/Co Multilayers." (1 2008).
  • McGilvery, C.M.; McFadzean, S.; MacKenzie, M.; Docherty, F.T. et al. "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." (1 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." (1 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." (1 2008).
  • Jantou, V.; McComb, D.W.; Horton, M.A. "Analytical transmission electron microscopy of mineralised dentin." (1 2008).
  • Lekstrom, M.; McLachlan, M.A.; Husain, S.; McComb, D.W. et al. "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." (1 2008).
  • Husain, S.; McComb, D.W.; Perkins, J.M.; Haswell, R. "Sample preparation and electron microscopy of hydrocracking catalysts." (1 2008).
  • Eustace,D,A; McComb,D,W; Buckle,L; Buckle,P; Ashley,T; Singh,L,J; Barber,Z,H; Gilbertson,A,M; Branford,W,R; Clowes,S,K; Cohen,L,F "(S)TEM Characterisation of InAs/MgO/Co Multilayers." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Eustace,D,A; Cheah,W,L; McComb,D,W; Docherty,F,T; Craven,A,J "Modelling paramagnetism in EELS: a study of magnetic order." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • MacKenzie,M; Craven,A,J; McComb,D,W; McGilvery,C,M; McFadzean,S; De Gendt,S "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Docherty,F,T; MacKenzie,M; Craven,A,J; McComb,D,W; De Gendt,S; McFadzean,S; McGilvery,C,M "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." in IEEE International Symposium on Advanced Gate Stack Technology (ISAGST). (1 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." (9 2008).
  • Kadkhodazadeh, S.; Ashwin, M.J.; Jones, T.S.; McComb, D.W. "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." (1 2008).
  • Kadkhodazadeh,S; Ashwin,M,J; Jones,T,S; McComb,D,W "Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery,C,M; McComb,D,W; MacKenzie,M; Craven,A,J; McFadzean,S; De Gendt,S "Analysis of hafnium containing powders and thin films for CMOS device applications." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: a study of magnetic order." (1 2008).
  • Berhanu,Sarah; McLachlan,Martyn,A; McComb,David,W; Jones,Tim,S "Colloidal Crystals as Nanostructured Templates for Organic Solar Cells." in Conference on Organic Photovoltaics IX. (1 2008).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; McGilvery, C.M. et al. "Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." in 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. (1 2008).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W. "Nanoanalysis of high-k dielectrics on semiconductors." (9 2008).
  • Docherty, F.T.; MacKenzie, M.; Craven, A.J.; McComb, D.W. et al. "A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon." in IEEE International Symposium on Advanced Gate Stack Technology (ISAGST). (1 2008).
  • McGilvery, C.M.; McComb, D.W.; MacKenzie, M.; Craven, A.J. et al. "Analysis of hafnium containing powders and thin films for CMOS device applications." (12 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." (9 2008).
  • Jasper, A.; Kilner, J.A.; McComb, D.W. "TEM and impedance spectroscopy of doped ceria electrolytes." in 16th International Conference on Solid State Ionics. (9 2008).
  • Craven,A,J; MacKenzie,M; McComb,D,W "Nanoanalysis of high-k dielectrics on semiconductors." in 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits. (1 2008).
  • Lekstrom,M; McLachlan,M,A; Husain,S; McComb,D,W; Shollock,B,A "Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • McGilvery,C,M; McFadzean,S; MacKenzie,M; Docherty,F,T; Craven,A,J; McComb,D,W; De Gendt,S "Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO." in 15th Conference on Microscopy of Semiconducting Materials. (1 2008).
  • Husain,S; McComb,D,W; Perkins,J,M; Haswell,R "Sample preparation and electron microscopy of hydrocracking catalysts." in Electron Microscopy and Analysis Group Conference. (1 2008).
  • Berhanu, S.; McLachlan, M.A.; McComb, D.W.; Jones, T.S. "Colloidal crystals as nanostructured templates for organic solar cells." (12 2008).
  • Jasper,A; Kilner,J,A; McComb,D,W "TEM and impedance spectroscopy of doped ceria electrolytes." in 16th International Conference on Solid State Ionics. (9 2008).
  • Eustace, D.A.; Cheah, W.L.; McComb, D.W.; Docherty, F.T. et al. "Modelling paramagnetism in EELS: A study of magnetic order." (12 2008).
  • Jantou,V; McComb,D,W; Horton,M,A "Analytical transmission electron microscopy of mineralised dentin." in Electron Microscopy and Analysis Group Conference. (1 2008).

2007

  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." (12 2007).
  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." (1 2007).
  • Barron,C,CA; McLachlan,M; Zhang,Q; McComb,D,W "Ferroelectric three-dimensionally ordered macroporous thin films." in Minisymposium on Electro-Optic Nanoarrays. (1 2007).
  • Barron, C.C.A.; McLachlan, M.; Zhang, Q.; McComb, D.W. "Ferroelectric three-dimensionally ordered macroporous thin films." in Minisymposium on Electro-Optic Nanoarrays. (1 2007).

2006

  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." (1 2006).
  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • Eustace, D.A.; Docherty, F.T.; McComb, D.W.; Craven, A.J. "ELNES as a probe of magnetic order in mixed oxides." (1 2006).
  • T Docherty, F.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." (1 2006).
  • T Docherty,F; MacKenzie,M; Pennicard,D; Craven,A,J; McComb,D,W "Understanding and preventing beam damage effects in partially processed high-k gate stacks." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • Eustace,D,A; Docherty,F,T; McComb,D,W; Craven,A,J "ELNES as a probe of magnetic order in mixed oxides." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).
  • Docherty, F.T.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." (1 2006).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; De Gendt, S. et al. "Advanced nano-analysis of a high-k dielectric stack." (12 2006).
  • T Docherty, F.; MacKenzie, M.; Pennicard, D.; Craven, A.J. et al. "Understanding and preventing beam damage effects in partially processed high-k gate stacks." in EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale. (1 2006).

2005

  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; De Gendt, S. "Advanced nano-analysis of high-k dielectric stacks." (12 2005).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." (6 2005).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." in 14th Biennial Conference on Insulating Films on Semiconductors. (6 2005).
  • Craven,A,J; MacKenzie,M; McComb,D,W; Docherty,F,T "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." in 14th Biennial Conference on Insulating Films on Semiconductors. (6 2005).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Docherty, F.T. "Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy." (6 2005).
  • Jin, C.; McLachlan, M.A.; McComb, D.W.; De La Ruea, R.M. et al. "Template-assisted self-assembly growth of (100) oriented three-dimensional photonic crystal." (12 2005).

2004

  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." (1 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - a probe of structure and bonding." (1 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." (10 2004).
  • Hamilton,D,A; Craven,A,J; MacKenzie,M; McComb,D,W "Understanding gate oxide materials: ELNES of Hf and Zr compounds." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Johnson,N,P; Khokhar,A,Z; McLachlan,M,A; McComb,D,W; De La Rue,R,M "Application of pressure to shift the bandgap in polystyrene based photonic crystals." in Conference on Photonic Crystal Materials and Nanostructures. (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." (1 2004).
  • Harkins,P; McComb,D,W; MacKenzie,M; Craven,A,J "ELNES of titanate perovskites - a probe of structure and bonding." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." (1 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - A probe of structure and bonding." (10 2004).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." (11 2004).
  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." in Conference on Photonic Crystal Materials and Nanostructures. (1 2004).
  • Johnson, N.P.; Khokhar, A.Z.; McLachlan, M.A.; McComb, D.W. et al. "Application of pressure to shift the bandgap in polystyrene based photonic crystals." (12 2004).
  • Harkins, P.; McComb, D.W.; MacKenzie, M.; Craven, A.J. "ELNES of titanate perovskites - a probe of structure and bonding." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." (10 2004).
  • Hamilton, D.A.; Craven, A.J.; MacKenzie, M.; McComb, D.W. "Understanding gate oxide materials: ELNES of Hf and Zr compounds." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • MacKenzie,M; Craven,A,J; McComb,D,W; Hamilton,D,A; McFadzean,S "Spectrum imaging of high-k dielectric stacks." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).
  • MacKenzie, M.; Craven, A.J.; McComb, D.W.; Hamilton, D.A. et al. "Spectrum imaging of high-k dielectric stacks." in Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003). (1 2004).

2003

  • Paxton,A,T; Craven,A,J; Gregg,J,M; McComb,D,W "Bandstructure approach to near edge structure." in International Workshop on Strategies and Advances in Atomic-Level Spectroscopy and Analysis (SALSA). (4 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure." in International Workshop on Strategies and Advances in Atomic-Level Spectroscopy and Analysis (SALSA). (4 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure.." (4 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure.." (4 2003).
  • Craven,A,J; MacKenzie,M; McComb,D,W; Hamilton,D,A "Application of spectrum imaging to the study of high-k dielectric stacks." in Conference on Microscopy of Semiconducting Materials. (1 2003).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." in Conference on Microscopy of Semiconducting Materials. (1 2003).
  • Paxton, A.T.; Craven, A.J.; Gregg, J.M.; McComb, D.W. "Bandstructure approach to near edge structure." (4 2003).
  • Craven, A.J.; MacKenzie, M.; McComb, D.W.; Hamilton, D.A. "Application of spectrum imaging to the study of high-k dielectric stacks." (1 2003).

2002

  • McComb, D.W. "Probing the electronic structure of transition metal oxides using electron energy-loss spectroscopy." (11 2002).
  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia." (1 2002).
  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia.." in Electrically Based Microstructural Characterization III Symposium held at the 2001 MRS Fall Meeting. (1 2002).
  • McComb,D,W; Ostanin,S; Vlachos,D; Craven,A,J; Finnis,M,W; Paxton,A,T; Alavi,A "The use of XANES and ELNES for the characterisation of stabilised zirconia.." in Electrically Based Microstructural Characterization III Symposium held at the 2001 MRS Fall Meeting. (1 2002).
  • McComb, D.W.; Ostanin, S.; Vlachos, D.; Craven, A.J. et al. "The use of XANES and ELNES for the characterisation of stabilised zirconia.." (1 2002).

2001

  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." (1 2001).
  • Johnson,N,P; McComb,D,W; Richel,A; Treble,B,M; De La Rue,R,M "Synthesis and optical properties of opal and inverse opal photonic crystals." in 4th International Topical Conference on Optical Probes on Pi-Conjugated Polymers and Photonic Crystals. (1 2001).
  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." (1 2001).
  • Maclean,E,DW; Craven,A,J; McComb,D,W "Valence losses at interfaces in aluminium alloys." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels.." (2 2001).
  • Ross,I,M; Rainforth,W,M; Scott,A,J; Brown,A,P; Brydson,R; McComb,D,W "Differentiation of zirconia polymorphs using EELS and ELNES." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • McComb,D,W; Treble,B,M; Smith,C,J; De La Rue,R,M; Johnson,N,P "Synthesis and characterisation of photonic crystals." in 3rd Materials Discussion Meeting of the Royal-Society-of-Chemistry (MD3). (1 2001).
  • Ross, I.M.; Rainforth, W.M.; Scott, A.J.; Brown, A.P. et al. "Differentiation of zirconia polymorphs using EELS and ELNES." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; McComb, D.W.; Scott, A.J. et al. "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; Scott, A.J.; Brown, A.P. et al. "Differentiation of zirconia polymorphs using EELS and ELNES." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." (1 2001).
  • Ross, I.M.; Rainforth, W.M.; McComb, D.W.; Scott, A.J. et al. "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • MacKenzie,M; Weatherly,G,C; McComb,D,W; Perovic,A; Craven,A,J "Interfacial reaction products in Al-based metal-matrix composites." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." (2 2001).
  • Johnson, N.P.; McComb, D.W.; Richel, A.; Treble, B.M. et al. "Synthesis and optical properties of opal and inverse opal photonic crystals." in 4th International Topical Conference on Optical Probes on Pi-Conjugated Polymers and Photonic Crystals. (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." in International Sympopsium on Spectroscopy of Materials. (2 2001).
  • Docherty,F,T; Craven,A,J; McComb,D,W; Skakle,J "ELNES investigations of the oxygen K-edge in spinels." in International Symposium on Spectroscopy of Materials. (2 2001).
  • Maclean, E.D.W.; Craven, A.J.; McComb, D.W. "Valence losses at interfaces in aluminium alloys." in Conference of the Electron-Microscopy-and Analysis-Group. (1 2001).
  • Maclean, E.D.W.; Craven, A.J.; McComb, D.W. "Valence losses at interfaces in aluminium alloys." (1 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." (1 2001).
  • Ross,I,M; Rainforth,W,M; McComb,D,W; Scott,A,J; Brydson,R "Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics." in Conference of the Electron-Microscopy-and-Analysis-Group. (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels.." (2 2001).
  • McComb, D.W.; Treble, B.M.; Smith, C.J.; De La Rue, R.M. et al. "Synthesis and characterisation of photonic crystals." in 3rd Materials Discussion Meeting of the Royal-Society-of-Chemistry (MD3). (1 2001).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W.; Skakle, J. "ELNES investigations of the oxygen K-edge in spinels." (2 2001).

2000

  • McComb, D.W.; Ning, X.G.; Weatherly, G.C.; Pan, J. et al. "Interfacial reaction chemistry in Al-based metal-matrix composites." (11 2000).
  • McComb, D.W.; Ning, X.G.; Weatherly, G.C.; Pan, J. et al. "Interfacial reaction chemistry in Al-based metal-matrix composites." (11 2000).

1999

  • Docherty, F.T.; Craven, A.J.; McComb, D.W. "ELNES investigations of the structure and electronic properties of chromium spinels." in Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99). (1 1999).
  • Docherty,F,T; Craven,A,J; McComb,D,W "ELNES investigations of the structure and electronic properties of chromium spinels." in Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 99). (1 1999).
  • Docherty, F.T.; Craven, A.J.; McComb, D.W. "ELNES investigations of the structure and electronic properties of chromium spinels." (1 1999).

1997

  • Yang,W; Weatherly,G,C; McComb,D,W; Lloyd,D,J "The structure of SiC-reinforced Mg casting alloys." in Meeting of Microscopy of Composite Materials III. (2 1997).
  • Perović, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs. misfit dislocation formation in GexSi1-x/Si (100) heterostructures." (5 1997).
  • Perovic, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." in Proceedings of the International Conference on Pattern Formation in Fluids and Materials CPiP 96 (Collective Phenomena in Physics 96). (5 1997).
  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." in Meeting of Microscopy of Composite Materials III. (2 1997).
  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." (4 1997).
  • Perovic,D,D; Bahierathan,B; Lafontaine,H; HOUGHTON,D,C; McComb,D,W "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." in Proceedings of the International Conference on Pattern Formation in Fluids and Materials CPiP 96 (Collective Phenomena in Physics 96). (5 1997).
  • Yang, W.; Weatherly, G.C.; McComb, D.W.; Lloyd, D.J. "The structure of SiC-reinforced Mg casting alloys." (2 1997).
  • Perovic, D.D.; Bahierathan, B.; Lafontaine, H.; Houghton, D.C. et al. "Kinetic critical thickness for surface wave instability vs misfit dislocation formation in GexSi1-x/Si(100) heterostructures." (5 1997).

1995

  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." in Symposium in Honor of R H Ritchie on His 70th Birthday - The Interaction of Swift Particles and Electromagnetic Fields with Matter. (5 1995).
  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." (5 1995).
  • McComb, D.W.; Howie, A. "Valence loss spectra from SiO2 polymorphs of different density." (5 1995).
  • McComb,D,W; Howie,A "VALENCE LOSS SPECTRA FROM SIO2 POLYMORPHS OF DIFFERENT DENSITY." in Symposium in Honor of R H Ritchie on His 70th Birthday - The Interaction of Swift Particles and Electromagnetic Fields with Matter. (5 1995).

1991

  • More, A.P.; McGibbon, A.J.; McComb, D.W. "Analysis of polymers in STEM using PEELS." (12 1991).
  • Payne, R.S.; Crick, R.A.; McComb, D.W. "SI-K ELNES from various local atomic environments (LAE)." (12 1991).
  • Payne,R,S; CRICK,R,A; McComb,D,W "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • McComb,D,W; Paterson,J,H; Buglass,J,G; Friedman,S,L "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • McComb, D.W.; Paterson, J.H.; Buglass, J.G.; Friedman, S.L. "High-angle ADF imaging of the osmium carbonyl cluster [Os20(CO)40]2-." (12 1991).
  • MCCOMB, D.W.; PATERSON, J.H.; BUGLASS, J.G.; FRIEDMAN, S.L. "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." (1 1991).
  • MORE, A.P.; MCGIBBON, A.J.; MCCOMB, D.W. "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." (1 1991).
  • PAYNE, R.S.; CRICK, R.A.; MCCOMB, D.W. "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." (1 1991).
  • PEROVIC, D.D.; MCCOMB, D.W.; MCGIBBON, A.J.; BROWN, L.M. "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." (1 1991).
  • PEROVIC, D.D.; MCCOMB, D.W.; MCGIBBON, A.J.; BROWN, L.M. "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MORE,A,P; McGibbon,A,J; McComb,D,W "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • Perovic, D.D.; McComb, D.W.; McGibbon, A.J.; Brown, L.M. "STEM characterisation of impurity atom distributions across grain boundaries using PEELS and HAADF imaging." (12 1991).
  • MCCOMB, D.W.; PATERSON, J.H.; BUGLASS, J.G.; FRIEDMAN, S.L. "HIGH-ANGLE ADF IMAGING OF THE OSMIUM CARBONYL CLUSTER [OS20(CO)40]2-." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • PAYNE, R.S.; CRICK, R.A.; MCCOMB, D.W. "SI-K ELNES FROM VARIOUS LOCAL ATOMIC ENVIRONMENTS (LAE)." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • Perovic,D,D; McComb,D,W; McGibbon,A,J; Brown,L,M "STEM CHARACTERIZATION OF IMPURITY ATOM DISTRIBUTIONS ACROSS GRAIN-BOUNDARIES USING PEELS AND HAADF IMAGING." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).
  • MORE, A.P.; MCGIBBON, A.J.; MCCOMB, D.W. "AN ANALYSIS OF POLYMERS IN STEM USING PEELS." in 1991 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INST OF PHYSICS ( EMAG 91 ). (1 1991).

1990

  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." (11 1990).
  • McComb, D.W.; Howie, A. "Characterisation of zeolite catalysts using electron energy loss spectroscopy." (1 1990).
  • McComb,D,W; Howie,A "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." in 1990 ANNUAL WORKSHOP ON THE CHARACTERIZATION OF CATALYSTS. (11 1990).
  • MCCOMB, D.W.; HOWIE, A. "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "CHARACTERIZATION OF ZEOLITE CATALYSTS USING ELECTRON-ENERGY LOSS SPECTROSCOPY." in 1990 ANNUAL WORKSHOP ON THE CHARACTERIZATION OF CATALYSTS. (11 1990).
  • MCCOMB, D.W.; HOWIE, A. "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." in CONF OF THE ROYAL MICROSCOPICAL SOC. (1 1990).
  • McComb,D,W; Howie,A "VALENCE LOSS SPECTROSCOPY OF ZEOLITES USING STEM." in 1989 CONF OF THE ELECTRON MICROSCOPY AND ANALYSIS GROUP OF THE INSTITUTE OF PHYSICS / ROYAL MICROSCOPICAL SOC ( EMAG-MICRO 89 ). (1 1990).
  • McComb,D,W; Howie,A "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." in CONF OF THE ROYAL MICROSCOPICAL SOC. (1 1990).
  • MCCOMB, D.W.; HOWIE, A. "ELECTRON-ENERGY LOSS SPECTROSCOPY AND BEAM DAMAGE STUDIES OF ZEOLITE CATALYSTS BY TEM AND STEM." (1 1990).

1989

  • McComb,D,W; Howie,A "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." in 1989 MEETING OF THE BRITISH ZEOLITE ASSOC : RECENT ADVANCES IN ZEOLITE SCIENCE. (1 1989).
  • McComb, D.W.; Howie, A. "Localized Electron Energy Loss Spectroscopy of Zeolite Catalysts in the Electron Microscope." (1 1989).
  • MCCOMB, D.W.; HOWIE, A. "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." (1 1989).
  • MCCOMB, D.W.; HOWIE, A. "LOCALIZED ELECTRON-ENERGY LOSS SPECTROSCOPY OF ZEOLITE CATALYSTS IN THE ELECTRON-MICROSCOPE." in 1989 MEETING OF THE BRITISH ZEOLITE ASSOC : RECENT ADVANCES IN ZEOLITE SCIENCE. (1 1989).

1981

  • Fraser, H.L.; Hsieh, K.C.; Twigg, M.E. "ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY IN MINERALS PROCESSING.." (12 1981).

1980

  • FRASER, H.L. "ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MINERAL PROCESSING." (1 1980).
  • FRASER, H.L. "ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MINERAL PROCESSING." (1 1980).