- Associate Professor, Materials Science Engineering
Columbus, OH 43212
Ongoing research focus on more efficient energy use and conversion, on more efficient transportation, and on environmental protecting technologies relies heavily on the advancement of (new) functional nanomaterials and nanosystems. At any stage in research and development, studies of these nanomaterials’ structure, property, and function are critical, including detailed atomic-scale insights.
To our advantage, atomic scale electron microscopy (EM) has become a powerful and indispensable tool for characterizing those nanostructures. Ongoing activities concentrate on methodological aspects of state-of-the-art EM and thereby open routes towards atom sensitive imaging of nanostructures that play a crucial role in numerous applications. However, the actual state and function of nanomaterials ‘in operation’ cannot always be inferred from examination under standard EM conditions or from postmortem studies. In-situ / operando techniques enable characterization of nanostructures under operational (or environmental) conditions, thereby providing new insights in important materials science questions, including basic phenomena associated with materials’ growth, phase transformations, stability, etc.
Dr. Jinschek is an Associate Professor in the Department of Materials Science and Engineering, and the ‘Materials and Manufacturing for Sustainability’ Discovery Theme at the Ohio State University. He received his M.S. and Ph.D in Physics and Solid State Physics, respectively, from the Friedrich-Schiller-University (FSU) in Jena, Germany (1997 and 2001, respectively). He then was awarded with an Alexander-von-Humboldt Feodor-Lynen-Fellowship (2001-2003) and held a post-doctoral fellowship at the National Center for Electron Microscopy at LBNL in Berkeley, CA (2001-2005). From 2005 to 2007 he was a Research Assistant Professor and the Director of the Electron Microscopy Lab at Virginia Tech in Blacksburg, VA. He then has moved to industry and held various positions at FEI Company, Eindhoven (NL), including Sr. Application Scientist for aberration-corrected & in-situ / environmental electron microscopy (TEM), as well as Sr. Product Marketing Manager in the Materials Science BU responsible for advanced in-situ TEM solutions and solution development for Chemistry of Materials.
Dr. Jinschek has strong expertise in high resolution and in-situ EM focusing on extracting materials’ structural information at the atomic scale using state-of-the-art methodologies. His group focuses on developing atomic scale in-situ / operando EM with the ability to directly observe and quantify dynamic transformational events in functional nanomaterials. These studies, combined with supplementary characterization techniques and computational modeling, will be essential to understand in more detail the link between atomic structures and unique properties on their characteristic length scales.