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Sam Luther clinches top honors for artistic microscopy in International Metallographic Contest

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nickel-based filler metal 52M DDC fracture surface imaged on an FEI Sirion microscope at CEMAS
 

The International Metallographic Contest (IMC) is a long-standing tradition among metallographers, scientists, technicians, and students. In its 47th consecutive year, the competition continues to recognize and promote the science of microstructural analysis in the fields of optical and electron microscopy. Sam Luther, a fourth year PhD welding engineering student, participated over the past three years earning him an honorable mention in 2017 and second place in Class 2 for 2018. Luther's entry this autumn earned the top spot in the Class 4 division for artistic color microscopy. (A description of classes is below.) He will be awarded a cash prize. Entries are judged at the Materials Science & Technology (MS&T) Conference, and winning images are displayed at ASM/IMS Headquarters and travel as an exhibition to universities, libraries, and other venues throughout the year. 

In a surprising twist, Sam was unaware that his award-winning entry was selected. He was not in attendance at MS&T in Portland where 2019 winners were announced. The editor of IMS SlipLines eNewsletter contacted Sam and congratulated him on his entry, "Dawn to Dusk", before requesting that the image be used as Image of the Month for their November issue. "Dawn to Dusk" is posted on the homepage of International Metallographic Society for the month of November and will be on the cover of the November/December issue of Advanced Materials & Processes magazine.  

Mr. Luther shares that the image background is a 10,000x-magnification image of the fracture surface of ductility-dip cracking in a nickel-based filler metal 52M multipass weld. Thermal faceting was observed on the surface, the varying topography serves as the background for each individual color. The fractured sample was ultrasonically cleaned, washed with ethanol, and baked out in a light furnace for about 30 minutes prior to imaging. The high resolution and high depth of field was achieved on an FEI Sirion Scanning Electron Microscope at the Center for Electron Microscopy and Analysis.

[The image] was originally for research purposes, and I decided to digitally enhance it for the artistic competition (Class 4).

- Sam Luther, fourth year PhD welding engineering student

Sam is quickly closing in on completing his degree and is interested in consulting or teaching. He hopes to remain in the Columbus area after graduation.

The Department of Materials Science and Engineering congratulates Sam Luther on creating a beautiful piece of art with his metallurgy and microscopy skills!

 

Competition classes for the International Metallographic Contest¹:
Classes 1-3 (class 3 is limited to undergraduate students)
multiple images and captions to be used in poster format to describe how metallurgy/microscopy was used to help solve a problem, characterize a material or process, or to describe a unique or unusual technique
Classes 4 and 5
artistic color, black and white images

 

¹ IMC Contest

Category: Centers

2020 International Metallographic Contest

The IMS/ASM International Metallographic Contest and Exhibit is being held in conjunction with the 2020 International Materials, Applications & Technologies (IMAT) Conference & Exhibition in Cleveland, Ohio September 14 - 17, 2020.

The contest features the best work of metallographers and microstructural analysts from around the world. Entrants do not have to be members of the International Metallographic Society or ASM International.

For rules and regulations etc., please visit the International Metallographic Contest information section of the International Metallographic Society website.

Steven Gentz (contest Chair)

steven.j.gentz@nasa.gov