Jinwoo Hwang's Research Group at Ohio State

What we do

We develop new atomic-scale characterization techniques based on scanning transmission electron microscopy (STEM) to investigate the structural origins of a wide range of important properties of materials. We combine the novel STEM techniques, including fluctuation microscopy, electron nano diffraction, and 4D-STEM, with advanced computational simulations to determine the important structure-property relationships beyond the limits of conventional characterization or simulation methods.

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